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Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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130 products available

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  1. Serialised SEM Pin Stubs with or without Pre-mounted Tabs
    Serialised standard 12.5mm dia aluminium pin stubs with pre-mounted carbon tabs.
    Average lead time: 1 to 21 days

    POA

    Average lead time: 1 to 21 days
  2. SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
    Average lead time: 1 to 28 days

    POA

    Average lead time: 1 to 28 days
  3. SEM Specimen Stubs - Short Pin
    SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
    Average lead time: 1 day

    POA

    Average lead time: 1 day
  4. SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
    In Stock

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    In Stock
  5. FEI Microtome 8mm SEM Stub
    A small diameter stub designed for FEI instruments but can also be used with other microscopes.
    Average lead time: 1 to 30 days

    POA

    Average lead time: 1 to 30 days
  6. Sample pins for Cryo-Ultramicrotomes
    Cryo sample pins with 2mm diameter pins compatible with Leica & RMC Cryo-Ultramicrotomes.
    Average lead time: 1 to 30 days

    POA

    Average lead time: 1 to 30 days
  7. Standard SEM Pin Stubs with Pre-mounted Tabs
    Standard 12.5mm dia pin stubs with pre-mounted carbon tabs.
    Average lead time: 1 to 10 days

    POA

    Average lead time: 1 to 10 days
  8. SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325
    SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium.
    In Stock

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    In Stock
  9. CorrStub® SEM specimen stubs for correlative microscopy
    CorrStub® is a unique range of SEM pin stubs specifically designed for correlative microscopy and forensic analysis.
    Average lead time: 1 to 10 days

    POA

    Average lead time: 1 to 10 days
  10. Slotted specimen stub AGG301D
    12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination.
    In Stock

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    In Stock
  11. SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
    In Stock

    POA

    In Stock
  12. SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
    In Stock

    POA

    In Stock
  13. SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
    In Stock

    POA

    In Stock
  14. SEM Specimen Stubs, 32mm dia, 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
    Average lead time: 1 day

    POA

    Average lead time: 1 day
  15. SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock

    POA

    In Stock
  16. SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock

    POA

    In Stock
  17. SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
    Average lead time: 14 days

    POA

    Average lead time: 14 days
  18. SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399F
    SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50. 
    In Stock

    POA

    In Stock
  19. SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
    Average lead time: 1 day

    POA

    Average lead time: 1 day
  20. SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309
    SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
    In Stock

    POA

    In Stock
  21. SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306A
    SEM Specimen Stubs for JEOL instruments. 10mm diameter.
    In Stock

    POA

    In Stock
  22. SEM Specimen Stubs, 10mm dia, 10mm high
    SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
    Average lead time: 1 to 14 days

    POA

    Average lead time: 1 to 14 days
  23. SEM Specimen Stubs, 32mm dia, 10mm high AGG318
    SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.
    In Stock

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    In Stock
  24. SEM Specimen Stubs, 32mm dia, re-entrant base AGG305
    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.
    In Stock

    POA

    In Stock
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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