Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
Serialised SEM Pin Stubs with or without Pre-mounted TabsSerialised standard 12.5mm dia aluminium pin stubs with pre-mounted carbon tabs.Average lead time: 1 to 21 daysPOA
Average lead time: 1 to 21 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 to 28 daysPOA
Average lead time: 1 to 28 days
SEM Specimen Stubs - Short PinSEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.Average lead time: 1 to 14 daysPOA
Average lead time: 1 to 14 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In StockPOA
In Stock
FEI Microtome 8mm SEM StubA small diameter stub designed for FEI instruments but can also be used with other microscopes.Average lead time: 1 to 30 daysPOA
Average lead time: 1 to 30 days
Sample pins for Cryo-UltramicrotomesCryo sample pins with 2mm diameter pins compatible with Leica & RMC Cryo-Ultramicrotomes.Average lead time: 1 to 30 daysPOA
Average lead time: 1 to 30 days
Standard SEM Pin Stubs with Pre-mounted TabsStandard 12.5mm dia pin stubs with pre-mounted carbon tabs.Average lead time: 10 daysPOA
Average lead time: 10 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium.Average lead time: 35 daysPOA
Average lead time: 35 days- CorrStub® SEM specimen stubs for correlative microscopyCorrStub® is a unique range of SEM pin stubs specifically designed for correlative microscopy and forensic analysis.Average lead time: 1 to 10 days
POA
Average lead time: 1 to 10 days 
Slotted specimen stub AGG301D12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination. Sold as singles.In StockPOA
In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In StockPOA
In Stock- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 day
POA
Average lead time: 1 day 
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.Average lead time: 14 daysPOA
Average lead time: 14 days
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399FSEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.Average lead time: 1 dayPOA
Average lead time: 1 day
SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306ASEM Specimen Stubs for JEOL instruments. 10mm diameter.In StockPOA
In Stock
SEM Specimen Stubs, 10mm dia, 10mm highSEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.Average lead time: 1 dayPOA
Average lead time: 1 day
SEM Specimen Stubs, 32mm dia, 10mm high AGG318SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.In StockPOA
In Stock
