Applications of these probes - Electrical AFM measurements including conductive atomic force microscopy (CAFM), piezo-response microscopy (PFM), electrostatic force microscopy (EFM), scanning kelvin probe microscopy (SKPM), scanning impedance microscopy (SIM) etc.
- SPARK 70 Pt - AC mode silicon AFM probes with Pt conductive coating... AGT705Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).Average lead time: 7 days
POA
Average lead time: 7 days - SPARK 350 Pt - AC mode silicon AFM probes with Pt conductive coating... AGT704Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).Average lead time: 7 days
POA
Average lead time: 7 days