Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.
For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.
- Critical Dimension Standards, 2.0mm to 1μm, CertifiedEconomically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 1μm for a magnification range from 10x - 20,000x. Certified.Average lead time: 14 to 30 days
POA
Average lead time: 14 to 30 days - Critical Dimension Standards, 2.0mm to 1μm, ISO CertifiedEconomically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 1μm for a magnification range from 10x - 20,000x. ISO Certified.Call for leadtime
POA
Call for leadtime - Critical Dimension Standards, 2.0mm to 1μm, TraceableEconomically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 1μm for a magnification range from 10x - 20,000x. Traceable.Call for leadtime
POA
Call for leadtime - Critical Dimension Standards, 2mm-100nm, CertifiedEconomically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 100nm for a magnification range up to 10 - 200,000x. Certified.Call for leadtime
POA
Call for leadtime - Critical Dimension Standards, 2mm-100nm, ISO CertifiedEconomically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 100nm for a magnification range up to 10 - 200,000x. ISO Certified.Average lead time: 1 to 30 days
POA
Average lead time: 1 to 30 days - Critical Dimension Standards, 2mm-100nm, TraceableEconomically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 100nm for a magnification range up to 10 - 200,000x. Traceable.Call for leadtime
POA
Call for leadtime - Bi-Directional Critical Dimension Standards, 2.0mm to 1μm, CertifiedEconomically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 1µm for a magnification range from 10x - 20,000x. Certified.Average lead time: 30 days
POA
Average lead time: 30 days - Bi-Directional Critical Dimension Standards, 2.0mm to 1μm, ISO...Economically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 1µm for a magnification range from 10x - 20,000x. ISO Certified.Average lead time: 1 to 30 days
POA
Average lead time: 1 to 30 days - Bi-Directional Critical Dimension Standards, 2.0mm to 1μm, TraceableEconomically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 1µm for a magnification range from 10x - 20,000x. Traceable.Average lead time: 30 days
POA
Average lead time: 30 days - Bi-Directional Critical Dimension Standards, 2mm-100nm, CertifiedEconomically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 100nm for a magnification range up to 10 - 200,000x.Average lead time: 1 to 30 days
POA
Average lead time: 1 to 30 days - Bi-Directional Critical Dimension Standards, 2mm-100nm, ISO CertifiedEconomically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 100nm for a magnification range up to 10 - 200,000x.Average lead time: 1 to 30 days
POA
Average lead time: 1 to 30 days - Bi-Directional Critical Dimension Standards, 2mm-100nm, TraceableEconomically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 100nm for a magnification range up to 10 - 200,000x.Average lead time: 30 days
POA
Average lead time: 30 days 
Boron substrates for SEM/EDX micro analysisDiamond polished, crystalline boron surfaces for semi-quantitative SEM/EDX analysis of carbonaceous samples, e.g. soot.Average lead time: 30 daysPOA
Average lead time: 30 days
1000 mesh calibration grid AGS1965A single 1000 mesh 3mm diameter TEM grid for calibration. Supplied in a vial.Average lead time: 28 daysPOA
Average lead time: 28 days
Polystyrene Latex ParticlesThis range of polystyrene particles is excellent for SEM calibration purposes.Average lead time: 1 dayPOA
Average lead time: 1 day
Glass Size StandardsGlass microspheres can be used in any application that requires a NIST traceable size standard with a narrow size distribution, and where sample conditions may not be suitable for polystyrene spheres.Average lead time: 1 to 200 daysPOA
Average lead time: 1 to 200 days- Gold on Carbon AGS1969 - High Resolution Test SpecimenHigh resolution test specimen with a particle size range from approximately 3 - 50nm. Special prices valid while stocks last.Average lead time: 1 to 45 days
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Average lead time: 1 to 45 days 
Geller Reference Standard MRS-3The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation. Magnifications from 10X to 50,000X. 2µm minimum pitch. Traceable to national labs for ISO9000 and ISO17025.Average lead time: 30 daysPOA
Average lead time: 30 days
Polystyrene latex spheresThis range of polystyrene latex spheres can be used for either SEM or TEM applications.Average lead time: 1 to 30 daysPOA
Average lead time: 1 to 30 days
Silicon Test SpecimenA silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick. Special prices valid while stocks last.Average lead time: 1 to 28 daysPOA
Average lead time: 1 to 28 days
Gold on Carbon AGS1987 - Ultra High Resolution Test SpecimenUltra high resolution test specimen with a particle size range from approximately <2 - 30nm.Average lead time: 1 to 45 daysPOA
Average lead time: 1 to 45 days
Geller Reference Standard MRS-4A fifth Generation, high magnification reference standard for instrument calibration from 10X to 200,000X (1/2µm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.Average lead time: 30 daysPOA
Average lead time: 30 days
Chessy Test Specimen AGS171The Chessy test specimen comprises more than 1.6 million gold squares on silicon which form a four-fold chequerboard pattern in a total size of 1cm2.In StockPOA
In Stock
