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Optimised Positioning Upon Sample

 

Special Tip Shape

 

The tip is located exactly at the end of the cantilever, which allows exact positioning of the tip apex over the region of interest on the sample surface.

 

Consistent cantilever and tip properties


State-of-the-art manufacturing process ensures consistency in cantilever and tip properties. High quality factor, smooth resonance curves, good cantilever reflectivity and excellent tip sharpness are some of the many advantages you can count on with every single OPUS silicon microcantilever.

 

Industry standard holder chips


OPUS microcantilever holder chips have industry standard dimensions (3.4 x 1.6 x 0.315mm) and fit all AFM systems that use unmounted probes. The individual cantilever models feature alignment grooves on the back surface of the chip.

 

High quality base silicon material

 

All OPUS silicon microcantilevers are manufactured from highly n-doped mono-crystalline silicon with resistivity in the range 0.01 - 0.025Ω-cm for static charge dissipation. The cantilever and chip surface is a (100) plane and the cantilevers point in the direction.

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23 products available

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  1. AFM cantilever, no coating 300kHz 26N/m
    Standard tapping mode AFM cantilever without coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  2. High frequency cantilever, no coating 1200kHz 100N/m
    High frequency tapping mode cantilever without coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  3. High freqencey cantilever, Al reflective coating 1200kHz 100N/m
    High frequency tapping mode cantilever with Al reflective coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  4. AFM cantilever, Al reflective coating 300kHz 26N/m
    Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  5. AFM cantilever, Al reflective coating 135kHz 9N/m
    Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  6. AFM cantilever, no coating 70kHz 2N/m
    Soft tapping mode AFM cantilever without coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  7. AFM cantilever, Al reflective coating 70kHz 2N/m
    !NEW! Soft tapping mode AFM cantilever with Al reflective coating. Topography measurement.
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  8. Three AFM cantilevers, without coating, 17/150/75kHz, 0.3/9/2.5N/m
    Three AFM cantilevers without coating for various applications. Topography measurement.  
    Average lead time: 20 days

    POA

    Average lead time: 20 days
  9. Three AFM cantilevers, Al reflective coating, 17/150/75kHz,...
    Three AFM cantilevers with Al reflective for various applications. Topography measurement.  
    Average lead time: 20 days

    POA

    Average lead time: 20 days
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23 products available

You've viewed 9 of 23 products

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