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AFM cantilever, Al reflective coating 135kHz 9N/m

Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.

All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGF711-10
AFM cantilever, Al reflective coating 135kHz 9N/m Pk10
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POA
POA
AGF711-24
AFM cantilever, Al reflective coating 135kHz 9N/m Pk24
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POA
POA
AGF711-50
AFM cantilever, Al reflective coating 135kHz 9N/m Pk50
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POA
POA
AGF711-100
AFM cantilever, Al reflective coating 135kHz 9N/m Pk100
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POA
POA
Product Description

The 200AC NA series is designed for AC mode AFM imaging of standard and soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Tip Side coating: none
Back Side coating: Al, 30nm

Features & Specifications
Cantilever
Single
Resonant Frequency (kHz)
135 (85 - 175)
Force Constant (N/m)
9 (3 - 22)
Tip Radius (nm)
< 7
Length (±10µm)
200
Width (±2µm)
10
Thickness (±0.5µm)
3.5
Tip Side Coating
None
Back Side Coating
Al, 30nm
Delivery & Returns
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.