Critical Dimension Standards

Economically priced, fully-featured, ISO 17025 compliant Critical Dimension Standards for calibration over a wide measurement range.

Economically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range.

NIST traceable with features from 2mm to 1µm for magnification 10-20,000x (ideal for desktop SEM). Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm.

NIST traceable with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm

Individually certified against a NIST standard with features from 2mm to 1µm for a magnification range from 10x - 20,000x; ideal for desk top SEMs and low to medium magnification applications.

Individually certified against NIST standard with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm.