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SEM Specimen Stubs, 10mm dia, stub angled 45°

SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
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AGG3309
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Product Description
SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium. Pack of 10.
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