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Specimen Preparation
SEM Specimen Stubs, 10mm dia, 10mm high, carbon

SEM Specimen Stubs, 10mm dia, 10mm high, carbon

SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high. Carbon.

Special prices valid while stocks last.

All prices exclude VAT.

Description

Product Description

If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.

Supplied individually.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.