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Resolution & Grey Level Test Specimens
Tin on Carbon AGS1937 - Universal Resolution Specimen

agar manufactured

Tin on Carbon AGS1937 - Universal Resolution Specimen

Universal resolution test specimen with a particle size range from approximately <5nm - 30um.

Special prices valid while stocks last.

All prices exclude VAT.

Description Tech Data

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGS1937 Universal Tin on Carbon Test Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin Loading...	Loading...	POA	POA
AGS1937A Universal Tin on Carbon Test Specimen on JEOL Stub 10 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1937B Universal Tin on Carbon Test Specimen on ISI Stub 15 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1937C Universal Tin on Carbon Test Specimen on Hitachi Stub 15 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1937D Universal Tin on Carbon Test Specimen on Customer Specified Stub* Loading...	Loading...	POA	POA
AGS1937E Universal Tin on Carbon Test Specimen on JEOL stub 12.5 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1937S Universal Tin on Carbon Specimen on Short Pin Stub Loading...	Loading...	POA	POA
AGS1937T Universal Tin on Carbon Test Specimen Unmounted, Thin Carbon Disc Loading...	Loading...	POA	POA
AGS1937U Universal Tin on Carbon Test Specimen Unmounted Loading...	Loading...	POA	POA

Product Description

This tin on carbon test specimen has a very wide size range of tin spheres which give high contrast when imaged in the SEM. The largest spheres can be used for basic column alignment at low magnification; intermediate sized spheres are useful for monitoring image shift when changing operating parameters or resolution checking at low kV; and the smallest spheres can be used for resolution checking and astigmatism correction at the very highest magnifications.

* When requesting a quote for AGS1937D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.

Technical Data

SEM Specimen mounts selection guide

*All unless otherwise specified.

Type	Mount	Part Code
AGSXXXX	Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin	AGG301
AGSXXXXA	JEOL specimen stub, 10 mm diameter, 10 mm height	AGG306
AGSXXXXB	ISI specimen stub, 15 mm diameter, 10 mm height	AGG307
AGSXXXXC	Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread	AGG3313
AGSXXXXD	Customer specified stub from our catalogue, or provide information on the stub you will send for mounting	-
AGSXXXXE	JEOL specimen stub, 12.5 mm diameter, 10 mm height	AGG3384
AGSXXXXT	Unmounted, thin carbon disc	-
AGSXXXXU	Unmounted	-

AGS1937, A, B, C, D, E, T, U Technical Datasheet AGS1937, A, B, C, D, E, T, U Technical Datasheet

Delivery & Returns

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.