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Reference specimens for backscattered electron detection systems

An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen.

All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGS1950
BSE Reference - Nickel/Copper
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POA
POA
AGS1951
BSE Reference - Palladium/Silver
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POA
POA
AGS1952
BSE Reference - Platinum/Gold
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POA
POA
AGS1954
BSE Reference - Aluminium/Silicon
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POA
POA
Product Description

An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen. Four reference specimens are now available that are suitable for testing the atomic number contrast performance of a backscattered electron detection system.

Each of the reference specimens consists of two high purity elements that have an atomic number difference of 1. They are in the form of two wires embedded side by side in a contrasting matrix.

The specimens are available as a single mount either 3mm or 5mm diameter brass or aluminium tubes or alternatively can be incorporated into a block of standards.

Visual shows: Electron micrograph of the nickel/copper backscattered electron reference specimen. BSE image at low magnification. The contrast difference between the two wires is visible due to the atomic number difference between the nickel/copper.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.