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Calibration Specimens on Ultra Thin Substrates

A range of gold on silicon and tin on silicon specimens specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem.

All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGS168VTSI
Gold on 230-330µm silicon substrate. 5-150nm
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POA
POA
AGS1969VTSI
Gold on 230-330µm silicon substrate. 3-50nm
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POA
POA
AGS1987VTSI
Gold on 230-330µm silicon substrate. 2-30nm
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POA
POA
AGS1988VTSI
Tin on 230-330µm silicon substrate. 20-400nm
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POA
POA
AGS1967VTSI
Tin on 230-330µm silicon substrate. 10-100nm
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POA
POA
AGS1937VTSI
Tin on 230-330µm silicon substrate. 5-30µm
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POA
POA
AGS168ZSI
Gold on 500µm silicon substrate. 30-300nm
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POA
POA
AGS168SI
Gold on 500µm silicon substrate. 5-150nm
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POA
POA
AGS1969SI
Gold on 500µm silicon substrate. 3-50nm
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POA
POA
AGS1987SI
Gold on 500µm silicon substrate. 2-30nm
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POA
POA
AGS1988SI
Tin on 500µm silicon substrate. 20-400nm
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POA
POA
AGS1967SI
Tin on 500µm silicon substrate. 10-100nm
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POA
POA
AGS1937SI
Tin on 500µm silicon substrate. 5-30µm
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POA
POA
AGS168ZVTSI
Gold on 230-330µm silicon substrate. 30-300nm
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POA
POA
Product Description

This range of gold on silicon and tin on silicon specimens has been specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem. The specimens have the same specifications as the larger standard calibration specimens but are prepared on a very thin silicon substrate. Specimens are supplied unmounted.

Sizes: 

500µm thick: regularly shaped, nominally 5 x 5mm 

230-330µm thick: irregularly shaped, variably sized 

Delivery & Returns
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.