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Certified Silicon Test Specimens

Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1%.
All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGS1930-CT
Certified Planotec Silicon Test Specimen Unmounted
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POA
POA
AGS1932-CT
Certified Planotec Silicon Test Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin
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POA
POA
AGS1932A-CT
Certified Planotec Silicon Test Specimen on JEOL Stub 10 mm dia., 10 mm height
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POA
POA
AGS1932B-CT
Certified Planotec Silicon Test Specimen on ISI Stub 15 mm dia., 10 mm height
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POA
POA
AGS1932C-CT
Certified Planotec Silicon Test Specimen on Hitachi Stub 15 mm dia., 10 mm height
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POA
POA
AGS1932D-CT
Certified Planotec Silicon Test Specimen on Customer Specified Stub*
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POA
POA
AGS1932E-CT
Certified Planotec silicon test specimen on 12.5mm JEOL stub
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POA
POA
AGS1934-CT
Certified Planotec Silicon Test Specimen for Incident Light Microscopy, mounted on black slide
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POA
POA
Product Description

Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1% and are supplied with a laboratory certificate as documented proof. The equipment is checked against a reference specimen calibrated by the NPL by laser beam interferometry.

Also see our recalibration service.

The silicon specimen can be supplied on any stub.

* When requesting a quote for AGS1932D-CT, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.

Technical DataDelivery & Returns
More Calibration Standards
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.