PELCO Tripod Polisher 590 Starter Kit
The PELCO Tripod Polisher 590 can be used to prepare a sample for both SEM and TEM cross-sectional analysis. This starter kit includes a variety of accessories.
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Product Description
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The PELCO® Tripod Polisher™ 590 can be used to prepare a sample for both TEM and SEM cross-sectional analysis.
For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals, and geological samples.
Features & Benefits
- Precise cross-sectioning at the TEM level
- Repeatable and rapid production of TEM samples
- Reduces ion milling time to minutes as opposed to hours
- Produces large thin areas over the entire specimen
The PELCO® Tripod Polisher™ 590 Starter Kit includes 1 of each of the items listed below:
| AG814-457 | 30μm Diamond Film, Ø8", plain back |
| AG814-456 | 15μm Diamond Film, Ø8", plain back |
| AG814-454 | 6μm Diamond Film, Ø8", plain back |
| AG814-452 | 1μm Diamond Film, Ø8", plain back |
| AG814-451 | 0.5μm Diamond Film, Ø8", plain back |
| AG816-12 | MultiTex Cloth, Ø8", PSA, pack of 10 |
| AG59317 | Glass Plate, 8" x 0.25" |
| AG815-120 | 0.05μm Colloidal Silica, 160z. |
| AG892-45 | Mounting Wax, 135 |
| AG1GC450 | Slotted TEM Grids, pack of 100 |
| AG17395 | Sample Cleaner, 4oz. |
| AG80915 | Cotton Swabs, pack of 50 |
| AG14005 | Petri Dish |
| AG14012 | Filter Paper |
| AG5398 | Tweezer Set |
| AG80932 | 3M Scotch Pad |
| AG81450 | Squeegee |
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