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PELCO Tripod Polisher

The PELCO Tripod Polisher 590 can be used to prepare a sample for both SEM and TEM cross-sectional analysis.

Special prices valid while stocks last. 

All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AG59100
Tripod Polisher™ 590TEM precision sample thinning for TEM
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POA
POA
AG59200
Tripod Polisher™ 590SEM precision sample thinning for SEM
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POA
POA
AG59300
Tripod Polisher™ 590TS precision sample thinning for TEM and SEM
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POA
POA
Product Description

The PELCO® Tripod Polisher™ 590 can be used to prepare a sample for both TEM and SEM cross-sectional analysis.

For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plain-view and cross-section samples from such diverse materials as ceramics, composites, metals, and geological samples.

Features & Benefits
  • Precise cross-sectioning at the TEM level
  • Repeatable and rapid production of TEM samples
  • Reduces ion milling time to minutes as opposed to hours
  • Produces large thin areas over the entire specimen

Each Tripod Polisher is supplied with a base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case and accessories listed under technical information. 

We have a range of replacement and optional accessories available, please visit our accessories page.

Technical DataDelivery & Returns
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.