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292nm reference standard

292nm pitch reference standard for very high resolution calibration of AFM, SEM, Auger and FIB.
All prices exclude VAT.
Name & Code
Grouped product items
Code & Description Availability Price Qty
AGS1867
292nm resolution standard on 12.5mm pin stub
Average lead time: 13 days
Average lead time: 13 days
POA
POA
AGS1867A
292nm resolution standard on 10mm JEOL stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1867B
292nm resolution on 15mm Topcon/ISI/ABT stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1867C
292nm resolution standard on 15mm Hitachi stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1867D
292nm resolution standard on customer stub *
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1867E
292nm resolution standard on 12.5mm JEOL stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1867U
292nm resolution standard, unmounted
Average lead time: 13 days
Average lead time: 13 days
POA
POA
AGS1868
292nm certified resolution standard on 12.5 mm pin stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1868A
292nm certified resolution standard on 10 mm JEOL stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1868B
292nm certified resolution on 15 mm Topcon/ISI/ABT stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1868C
292nm certified resolution standard on 15 mm Hitachi stub
Average lead time: 29 days
Average lead time: 29 days
POA
POA
AGS1868D
292nm certified resolution standard on customer stub *
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1868E
292nm certified resolution standard on 12.5 mm JEOL stub
Average lead time: 44 days
Average lead time: 44 days
POA
POA
AGS1868S
292nm certified resolution standard on Short Pin Stub
Average lead time: 27 days
Average lead time: 27 days
POA
POA
Product Description

The 292nm pitch is accurate to ±1%. The surface structure is titanium lines on silicon. The line height is approximately 30nm with a line width of 130nm (not calibrated).

For SEM it can be used for a wide range of accelerating voltages.  For AFM it can be used in contact, tapping, and other modes, with image sizes from 500nm to 20µm.

It can be supplied either non-certified or with a non-traceable manufacturer’s certificate stating average pitch based on batch measurements.

A traceable, certified version measured in comparison with a standard calibrated at the German PTB (Physikalisch-Technische Bundesanstalt) can also be supplied - please enquire.

Delivery & Returns
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