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High Resolution silicon probes

High Resolution silicon probes.
All prices exclude VAT.
Name & Code
Grouped product items
Code & Description Availability Price Qty
AGF1690-5
High Resolution silicon probe Cr Au coated 125x25x2.1 um - Pack of 5
Average lead time: 29 days
Average lead time: 29 days
POA
POA
AGF1700-5
High Resolution silicon probe Cr Au coated 125x30x4.0 um - Pack of 5
Average lead time: 29 days
Average lead time: 29 days
POA
POA
AGF1710-5
High Resolution silicon probe Cr Au coated 225x37.5x7.0um - Pack of 5
Average lead time: 29 days
Average lead time: 29 days
POA
POA
Product Description

The High Resolution probes suffer less contamination than silicon probes and are capable of obtaining many high-resolution scans, although they do require special care in use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.

Advantages of High Resolution probes are noticeable when scanning small areas (<250nm) and flat samples (Ra <20nm). On larger images, the resolution is similar to that of General Purpose probes.

Key Features

  • Spike radius - <1nm
  • Spike height - 100-200nm
  • Spike material - diamond-like
  • Au overall coating - 30nm
  • Cr overall sublayer - 20nm
Technical DataDelivery & Returns
COVID-19: Please note that while we are working closely with our suppliers to minimise the effect of the COVID-19 pandemic, prices and availability may be subject to change at short notice.