The High Resolution probes suffer less contamination than silicon probes and are capable of obtaining many high-resolution scans, although they do require special care in use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.
Advantages of High Resolution probes are noticeable when scanning small areas (<250nm) and flat samples (Ra <20nm). On larger images, the resolution is similar to that of General Purpose probes.
- Spike radius - <1nm
- Spike height - 100-200nm
- Spike material - diamond-like
- Au overall coating - 30nm
- Cr overall sublayer - 20nm
|Width ±3µm ||25||30||22.5|
|Thickness ±0.5µm ||2.1||4.0||1.0|
|Resonance frequency kHz (typical)||160||325||65|
|Resonance frequency kHz (range)||110-220||265-410||25-120|
|Force constant n/m (typical)||5.0||40.0||0.5|
|Force constant n/m (range)||1.8-13||20-80||0.05-2.3|
High Resolution Silicon Probes are packaged in special vacuum-sealed ESD shielding bags. While the probes remain in the closed ESD protective bag, there is no risk of ESD damage.
Before opening the ESD bag in an ESD-protected area please ensure that you are grounded (e.g. with a static dissipative wrist strap or ESD-protective footwear) and the gel box is on ground potential (e.g. by using a grounded pad).
Before opening the gel box please ensure that the delivered probes are consistent with your order and there is no sign of transportation damage (e.g. loose AFM probes).