Very high resolution calibration standards for AFM, SEM, Auger & FIB

A range of very high resolution reference calibration standards for AFM, SEM, Auger & FIB.

Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...
This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.
Average lead time: 1 to 14 days
From £104.40
Average lead time: 1 to 14 days
Critical dimension (CD) calibration test specimens - 500-200-100 nm...
This advanced CD calibration test specimen is suitable for calibrating smaller structures.
Average lead time: 14 days
From £773.32
Average lead time: 14 days
292nm Reference Standard
292nm pitch reference standard for very high resolution calibration of AFM, SEM, Auger and FIB.
Average lead time: 14 to 45 days
Average lead time: 14 to 45 days
SEM 144nm Reference Standard
These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
Average lead time: 14 to 45 days
POA
Average lead time: 14 to 45 days
SEM 144nm Reference Standard, Certified
These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
Average lead time: 14 to 45 days
POA
Average lead time: 14 to 45 days
SEM 300nm Reference Standard
These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
Average lead time: 14 to 45 days
POA
Average lead time: 14 to 45 days
Tantalum pentoxide ion sputter standard AGS1806
Films of tantalum pentoxide (approximately 100nm) are anodically grown on 0.5mm thick tantalum foil.
Average lead time: 35 days
£461.46
Average lead time: 35 days