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A range of very high resolution reference calibration standards for AFM, SEM, Auger & FIB.

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10 products available

You've viewed 9 of 10 products

  1. Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...
    This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.
    Average lead time: 13 days

    From £95.05

    Average lead time: 13 days
  2. Critical dimension (CD) calibration test specimens - 500-200-100 nm...
    This advanced CD calibration test specimen is suitable for calibrating smaller structures.
    Average lead time: 13 days

    From £704.10

    Average lead time: 13 days
  3. 292nm reference standard
    292nm pitch reference standard for very high resolution calibration of AFM, SEM, Auger and FIB.
    Average lead time: 13 to 44 days
    Average lead time: 13 to 44 days
  4. SEM 144nm reference standard
    These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
    Average lead time: 13 to 44 days

    POA

    Average lead time: 13 to 44 days
  5. SEM 144nm reference standard, certified
    These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
    Average lead time: 13 to 44 days

    POA

    Average lead time: 13 to 44 days
  6. SEM 300nm reference standard
    These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
    Average lead time: 13 to 44 days

    POA

    Average lead time: 13 to 44 days
  7. MetroChip calibration standard AGS1949
    The MetroChip microscope calibration standard provides an extensive range of features for SEM, FIB, AFM, light microscopy and metrology systems calibration.
    In Stock
    £985.30
    In Stock
  8. Silicon nitride ion sputter standard AGS1805
    100nm silicon nitride (CVD) films deposited on a piece of silicon wafer, 1 x 3cm.
    Average lead time: 13 days
    £384.01
    Average lead time: 13 days
  9. Tantalum pentoxide ion sputter standard AGS1806
    Films of tantalum pentoxide (approximately 100nm) are anodically grown on 0.5mm thick tantalum foil.
    Average lead time: 13 days
    £404.22
    Average lead time: 13 days
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LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
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