A range of very high resolution reference calibration standards for AFM, SEM, Auger & FIB.
Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.Average lead time: 1 to 13 daysFrom £102.31
Average lead time: 1 to 13 days
Critical dimension (CD) calibration test specimens - 500-200-100 nm...This advanced CD calibration test specimen is suitable for calibrating smaller structures.Average lead time: 13 daysFrom £757.85
Average lead time: 13 days
292nm Reference Standard292nm pitch reference standard for very high resolution calibration of AFM, SEM, Auger and FIB.Average lead time: 13 to 44 daysAverage lead time: 13 to 44 days
SEM 144nm reference standardThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Average lead time: 13 to 44 daysPOA
Average lead time: 13 to 44 days
SEM 144nm reference standard, certifiedThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Average lead time: 13 to 44 daysPOA
Average lead time: 13 to 44 days
SEM 300nm reference standardThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Average lead time: 13 to 44 daysPOA
Average lead time: 13 to 44 days
Tantalum pentoxide ion sputter standard AGS1806Films of tantalum pentoxide (approximately 100nm) are anodically grown on 0.5mm thick tantalum foil.Average lead time: 13 days£435.09Average lead time: 13 days