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These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications. The 38° complimentary angle pin stub is suitable for FEI DualBeam™ and FIB systems, while the 36° complimentary angle pin stub is for Zeiss/Leo CrossBeam® and NVision systems. The stubs are fully compatible with standard pin stub mounts (3.2mm diameter pin) for sample storage and transport. These stubs can also be used with adapters in Hitachi, JEOL and ISI systems.

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6 products available

You've viewed 6 of 6 products

  1. SEM Specimen Stubs, 12.7mm dia, low profile
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
    Average lead time: 13 days

    From £25.94

    Average lead time: 13 days
  2. SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profile
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
    Average lead time: 20 days

    From £20.61

    Average lead time: 20 days
  3. SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profile
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
    Average lead time: 20 days

    From £29.07

    Average lead time: 20 days
  4. SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low...
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
    Average lead time: 29 days

    From £26.17

    Average lead time: 29 days
  5. SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profile
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
    Average lead time: 13 days

    From £38.22

    Average lead time: 13 days
  6. SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low...
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
    Average lead time: 13 days

    From £33.98

    Average lead time: 13 days
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6 products available

You've viewed 6 of 6 products

LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
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