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Agar Scientific and NanoScope Services are partnering to offer two unique FIB services in specimen preparation. Focussed Ion Beam or FIB offers many possibilities for preparing sections not possible using more conventional mechanical polishing or sectioning methods.

  • FIB prepared ‘Ultra thin’ TEM sections . This tried and tested process has been used routinely for many years and successfully applied by NanoScope to prepare customers samples from over 200 material types.
  • FIB prepared Micro-Cross Sections. FIB can precisely locate and section a feature on a sample and directly take images of it. Multiple slices can be taken through the same feature.
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  1. FIB prepared TEM sectioning service
    FIB prepared TEM sections (Foils/Lamella) prepared from your sample.
    Average lead time: 30 days

    From £56.93

    Average lead time: 30 days
  2. FIB prepared Micro-Cross Sectioning and Imaging Service
    FIB can precisely locate and section a feature on a sample and directly take images of it.
    Average lead time: 30 days

    From £11.39

    Average lead time: 30 days
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2 products available

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LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
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