Menu
ORDER ONLINE - quick & easy
AGENTS & DISTRIBUTORS - available worldwide
REQUEST QUOTES - fast online pricing

SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.

For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments.

The specimens can be supplied on most types of specimen stub.

Filters
Page

21 products available

You've viewed 9 of 21 products

  1. Gold on carbon AGS1969 - high resolution test specimen
    High resolution test specimen with a particle size range from approximately 3 - 50nm.
    Average lead time: 1 to 27 days

    From £102.28

    Average lead time: 1 to 27 days
  2. Gold on carbon AGS1987 - ultra high resolution test specimen
    Ultra high resolution test specimen with a particle size range from approximately
    Average lead time: 1 to 27 days

    From £167.10

    Average lead time: 1 to 27 days
  3. Tin on carbon AGS1967 - resolution test specimen
    Resolution test specimen with a particle size range from approximately 10 - 100nm.
    Average lead time: 1 to 27 days

    From £92.19

    Average lead time: 1 to 27 days
  4. Medium resolution aluminium-tungsten dendrites AGS145
    The various spacings created by the dendritic structure of this specimen are suitable for performing point resolution tests and the topographical arrangement of the dendrites for a grey level test.
    Average lead time: 13 days
    £188.64
    Average lead time: 13 days
  5. Gold on carbon AGS168Z - low voltage resolution test specimen
    Low voltage resolution test specimen with a particle size range from approximately
    Average lead time: 1 to 27 days

    From £85.80

    Average lead time: 1 to 27 days
  6. Tin on carbon AGS1988 - low voltage resolution test specimen
    Low voltage resolution test specimen with a particle size range from approximately
    Average lead time: 1 to 27 days

    From £123.88

    Average lead time: 1 to 27 days
  7. Tin on carbon AGS1937 - universal resolution specimen
    Universal resolution test specimen with a particle size range from approximately <5nm - 30um.
    Average lead time: 1 to 27 days

    From £126.76

    Average lead time: 1 to 27 days
  8. Calibration specimens on ultra thin substrates
    A range of gold on silicon and tin on silicon specimens specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem.
    Average lead time: 1 to 44 days

    From £81.90

    Average lead time: 1 to 44 days
  9. Pelco Nanogold resolution test standards for SEM and FESEM
    Unique gold nanoparticles on silicon provide resolution standards with known and uniform particle size, ideally suited for high resolution tests for SEM, FESEM and FIB/SEM systems.
    Average lead time: 13 to 44 days

    From £151.06

    Average lead time: 13 to 44 days
Filters
Page

21 products available

You've viewed 9 of 21 products

LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
FILTERS
VIEW PRODUCTS Cancel