Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.
For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.
- Critical Dimension StandardsEconomically priced, fully-featured, ISO 17025 compliant Critical Dimension Standards for calibration over a wide measurement range.Average lead time: 1 to 29 daysFrom £56.22Average lead time: 1 to 29 days
- Bi-Directional Critical Dimension StandardsEconomically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range.Average lead time: 1 to 29 daysFrom £80.90Average lead time: 1 to 29 days
Pelcotec CDMS 1T Critical Dimension Magnification StandardNIST traceable with features from 2mm to 1µm for magnification 10-20,000x (ideal for desktop SEM). Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm.Average lead time: 13 to 29 daysFrom £81.91
Average lead time: 13 to 29 days
Pelcotec CDMS 0.1T Critical Dimension Magnification StandardNIST traceable with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nmAverage lead time: 13 to 29 daysFrom £456.51
Average lead time: 13 to 29 days
Pelcotec CDMS 1C Critical Dimension Magnification StandardIndividually certified against a NIST standard with features from 2mm to 1µm for a magnification range from 10x - 20,000x; ideal for desk top SEMs and low to medium magnification applications.Average lead time: 13 daysFrom £685.42
Average lead time: 13 days
Pelcotec CDMS 0.1C Critical Dimension Magnification StandardIndividually certified against NIST standard with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm.Average lead time: 1 to 20 daysFrom £977.58
Average lead time: 1 to 20 days
Boron substrates for SEM/EDX micro analysisDiamond polished, crystalline boron surfaces for semi-quantitative SEM/EDX analysis of carbonaceous samples, e.g. soot.Average lead time: 29 daysFrom £378.78
Average lead time: 29 days
1000 mesh calibration grid AGS1965A single 1000 mesh 3mm diameter TEM grid for calibration. Supplied in a vial.In Stock£14.96In Stock
Fine meshThis is available in copper, nickel or gold, in 1000, 1500 and 2000 mesh (1000, 1500 or 2000 repeat distance per inch), ie. 25, 18.75 and 12.5µm.Average lead time: 1 to 13 daysFrom £19.41
Average lead time: 1 to 13 days
Electroformed mesh - NickelElectroformed mesh in Nickel with an approximate thickness of 5 micron. Available 5, 20, 70, 80, 100, 200, 333, 400, 500, 750, 1000, 1500 and 2000 mesh sizes.Average lead time: 6 to 69 daysFrom £372.94
Average lead time: 6 to 69 days
Electroformed mesh - CopperElectroformed mesh in Copper with an approximate thickness of 5 micron. Available 5, 20, 70, 80, 100, 200, 333, 400, 500, 750, 1000, 1500 and 2000 mesh sizes.Average lead time: 6 to 34 daysFrom £996.82
Average lead time: 6 to 34 days
Electroformed Mesh - GoldElectroformed mesh in Gold with an approximate thickness of 5 micron. Available 5, 20, 70, 80, 100, 200, 333, 400, 500, 750, 1000, 1500 and 2000 mesh sizes.Average lead time: 6 to 20 daysPOA
Average lead time: 6 to 20 days
Polystyrene Latex ParticlesThis range of polystyrene particles is excellent for SEM calibration purposes.Average lead time: 1 dayFrom £19.41
Average lead time: 1 day
Glass Size StandardsGlass microspheres can be used in any application that requires a NIST traceable size standard with a narrow size distribution, and where sample conditions may not be suitable for polystyrene spheres.Average lead time: 29 daysPOA
Average lead time: 29 days
Gold on Carbon AGS1969 - High Resolution Test SpecimenHigh resolution test specimen with a particle size range from approximately 3 - 50nm.Average lead time: 1 to 44 daysFrom £110.09
Average lead time: 1 to 44 days
Geller Reference Standard MRS-3The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation. Magnifications from 10X to 50,000X. 2µm minimum pitch. Traceable to national labs for ISO9000 and ISO17025.Average lead time: 29 daysPOA
Average lead time: 29 days
Polystyrene latex spheresThis range of polystyrene latex spheres can be used for either SEM or TEM applications.Average lead time: 1 to 29 daysFrom £22.47
Average lead time: 1 to 29 days
Silicon Test SpecimenA silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick.Average lead time: 1 to 27 daysFrom £59.88
Average lead time: 1 to 27 days
Gold on Carbon AGS1987 - Ultra High Resolution Test SpecimenUltra high resolution test specimen with a particle size range from approximatelyAverage lead time: 1 to 44 daysFrom £179.85
Average lead time: 1 to 44 days
Geller Reference Standard MRS-4A fifth Generation, high magnification reference standard for instrument calibration from 10X to 200,000X (1/2µm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.Average lead time: 29 daysPOA
Average lead time: 29 days
Chessy Test Specimen AGS171The Chessy test specimen comprises more than 1.6 million gold squares on silicon which form a four-fold chequerboard pattern in a total size of 1cm2.In Stock£1,287.59In Stock
Geller Reference Standard MRS-6A fifth generation Magnification Reference Standard & Stage Micrometer for instrument calibration from 1,500X to 1,000,000X (80nm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.Average lead time: 29 daysAverage lead time: 29 days
Tin on Carbon AGS1967 - Resolution Test SpecimenResolution test specimen with a particle size range from approximately 10 - 100nm.Average lead time: 1 to 44 daysFrom £99.23
Average lead time: 1 to 44 days
Medium resolution aluminium-tungsten dendrites AGS145The various spacings created by the dendritic structure of this specimen are suitable for performing point resolution tests and the topographical arrangement of the dendrites for a grey level test.Average lead time: 13 days£203.04Average lead time: 13 days
