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Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.

 

SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.

For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.

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44 products available

You've viewed 24 of 44 products

  1. Critical Dimension Standards
    Economically priced yet fully-featured Critical Dimension Standard for calibration over a wide measurement range.
    Average lead time: 1 to 30 days
    From £56.22
    Average lead time: 1 to 30 days
  2. Bi-Directional Critical Dimension Standards
    Economically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range.
    Average lead time: 1 to 30 days
    From £80.90
    Average lead time: 1 to 30 days
  3. Pelcotec CDMS 1T Critical Dimension Magnification Standard
    NIST traceable with features from 2mm to 1µm for magnification 10-20,000x (ideal for desktop SEM). Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm.
    Average lead time: 14 to 30 days

    From £81.91

    Average lead time: 14 to 30 days
  4. Pelcotec CDMS 0.1T Critical Dimension Magnification Standard
    NIST traceable with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm
    Average lead time: 14 to 30 days

    From £456.51

    Average lead time: 14 to 30 days
  5. Pelcotec CDMS 1C Critical Dimension Magnification Standard
    Individually certified against a NIST standard with features from 2mm to 1µm for a magnification range from 10x - 20,000x; ideal for desk top SEMs and low to medium magnification applications.
    Average lead time: 14 days

    From £685.42

    Average lead time: 14 days
  6. Pelcotec CDMS 0.1C Critical Dimension Magnification Standard
    Individually certified against NIST standard with features from 2mm to 100nm for magnification 10-200,000x for SE, FESEM and FIB. Feature sizes: 2mm, 1mm, 0.5mm, 0.25mm, 10µm, 5µm, 2µm, and 1µm, 500nm, 250nm, and 100nm.
    Average lead time: 14 to 21 days

    From £977.58

    Average lead time: 14 to 21 days
  7. Boron substrates for SEM/EDX micro analysis
    Diamond polished, crystalline boron surfaces for semi-quantitative SEM/EDX analysis of carbonaceous samples, e.g. soot.
    Average lead time: 30 days

    From £378.78

    Average lead time: 30 days
  8. 1000 mesh calibration grid AGS1965
    A single 1000 mesh 3mm diameter TEM grid for calibration. Supplied in a vial.
    In Stock
    £14.96
    In Stock
  9. Fine mesh
    This is available in copper, nickel or gold, in 1000, 1500 and 2000 mesh (1000, 1500 or 2000 repeat distance per inch), ie. 25, 18.75 and 12.5µm.
    Average lead time: 1 to 14 days

    From £19.41

    Average lead time: 1 to 14 days
  10. Electroformed mesh - Nickel
    Electroformed mesh in Nickel with an approximate thickness of 5 micron. Available 5, 20, 70, 80, 100, 200, 333, 400, 500, 750, 1000, 1500 and 2000 mesh sizes.
    Average lead time: 7 to 70 days

    From £372.94

    Average lead time: 7 to 70 days
  11. Electroformed mesh - Copper
    Electroformed mesh in Copper with an approximate thickness of 5 micron. Available 5, 20, 70, 80, 100, 200, 333, 400, 500, 750, 1000, 1500 and 2000 mesh sizes.
    Average lead time: 7 to 35 days

    From £996.82

    Average lead time: 7 to 35 days
  12. Electroformed Mesh - Gold
    Electroformed mesh in Gold with an approximate thickness of 5 micron. Available 5, 20, 70, 80, 100, 200, 333, 400, 500, 750, 1000, 1500 and 2000 mesh sizes.
    Average lead time: 7 to 21 days

    POA

    Average lead time: 7 to 21 days
  13. Polystyrene Latex Particles
    This range of polystyrene particles is excellent for SEM calibration purposes.
    Average lead time: 1 day

    From £19.41

    Average lead time: 1 day
  14. Glass Size Standards
    Glass microspheres can be used in any application that requires a NIST traceable size standard with a narrow size distribution, and where sample conditions may not be suitable for polystyrene spheres.
    Average lead time: 30 days

    POA

    Average lead time: 30 days
  15. Gold on Carbon AGS1969 - High Resolution Test Specimen
    High resolution test specimen with a particle size range from approximately 3 - 50nm.
    Average lead time: 1 to 45 days

    From £110.09

    Average lead time: 1 to 45 days
  16. Geller Reference Standard MRS-3
    The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation. Magnifications from 10X to 50,000X. 2µm minimum pitch. Traceable to national labs for ISO9000 and ISO17025.
    Average lead time: 30 days

    POA

    Average lead time: 30 days
  17. Polystyrene latex spheres
    This range of polystyrene latex spheres can be used for either SEM or TEM applications.
    Average lead time: 1 to 14 days

    From £22.47

    Average lead time: 1 to 14 days
  18. Silicon Test Specimen
    A silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick.
    Average lead time: 1 to 28 days

    From £59.88

    Average lead time: 1 to 28 days
  19. Gold on Carbon AGS1987 - Ultra High Resolution Test Specimen
    Ultra high resolution test specimen with a particle size range from approximately
    Average lead time: 1 to 45 days

    From £179.85

    Average lead time: 1 to 45 days
  20. Geller Reference Standard MRS-4
    A fifth Generation, high magnification reference standard for instrument calibration from 10X to 200,000X (1/2µm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.
    Average lead time: 30 days

    POA

    Average lead time: 30 days
  21. Chessy Test Specimen AGS171
    The Chessy test specimen comprises more than 1.6 million gold squares on silicon which form a four-fold chequerboard pattern in a total size of 1cm2.
    In Stock
    £1,287.59
    In Stock
  22. Tin on Carbon AGS1967 - Resolution Test Specimen
    Resolution test specimen with a particle size range from approximately 10 - 100nm.
    Average lead time: 1 to 45 days

    From £99.23

    Average lead time: 1 to 45 days
  23. Medium resolution aluminium-tungsten dendrites AGS145
    The various spacings created by the dendritic structure of this specimen are suitable for performing point resolution tests and the topographical arrangement of the dendrites for a grey level test.
    In Stock
    £203.04
    In Stock
  24. Geller reference standard re-callibration service
    Geller MicroAnalytical magnification standards can be cleaned and re-certified to assure continued use as a traceable standard.
    Average lead time: 21 days

    POA

    Average lead time: 21 days
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44 products available

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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