SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

Serialised SEM Pin Stubs with or without Pre-mounted Tabs
Serialised standard 12.5mm dia aluminium pin stubs with pre-mounted carbon tabs.
Average lead time: 1 to 20 days
From £32.55
Average lead time: 1 to 20 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
Average lead time: 1 to 13 days
From £9.78
Average lead time: 1 to 13 days
SEM Specimen Stubs - Short Pin
SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
Average lead time: 1 day
From £24.84
Average lead time: 1 day
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
In Stock
£26.88
In Stock
FEI Microtome 8mm SEM Stub
A small diameter stub designed for FEI instruments but can also be used with other microscopes.
Average lead time: 1 to 29 days
From £12.91
Average lead time: 1 to 29 days
Sample pins for Cryo-Ultramicrotomes
Cryo sample pins with 2mm diameter pins compatible with Leica & RMC Cryo-Ultramicrotomes.
Average lead time: 1 to 29 days
From £17.70
Average lead time: 1 to 29 days
Standard SEM Pin Stubs with Pre-mounted Tabs
Standard 12.5mm dia pin stubs with pre-mounted carbon tabs.
Average lead time: 1 to 9 days
From £15.95
Average lead time: 1 to 9 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325
SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium.
In Stock
£61.83
In Stock
SALE
CorrStub® SEM specimen stubs for correlative microscopy
CorrStub® is a unique range of SEM pin stubs specifically designed for correlative microscopy and forensic analysis.
Average lead time: 1 to 9 days
From £10.71
Average lead time: 1 to 9 days
Slotted specimen stub AGG301D
12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination. Sold as singles.
In Stock
£6.86
In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
In Stock
£3.65
In Stock
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
In Stock
£4.58
In Stock
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
In Stock
£4.57
In Stock
SALE
SEM Specimen Stubs, 32mm dia, 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
Average lead time: 1 day
From £85.14
Average lead time: 1 day
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
In Stock
£13.61
In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
In Stock
£16.57
In Stock
SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
Average lead time: 13 days
£140.89
Average lead time: 13 days
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399F
SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.
In Stock
£67.82
In Stock
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
Average lead time: 1 day
From £26.58
Average lead time: 1 day
SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309
SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
In Stock
£11.08
In Stock
SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306A
SEM Specimen Stubs for JEOL instruments. 10mm diameter.
In Stock
£13.28
In Stock
SEM Specimen Stubs, 10mm dia, 10mm high
SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
Average lead time: 1 to 13 days
From £15.79
Average lead time: 1 to 13 days
SEM Specimen Stubs, 32mm dia, 10mm high AGG318
SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.
In Stock
£90.60
In Stock
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305
SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.
In Stock
£99.11
In Stock