SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
All prices exclude VAT.Please note we are undergoing a system upgrade, so order processing may take longer than usual.
ORDER ONLINE - no minimum order value
AGENTS & DISTRIBUTORS - available worldwide
REQUEST QUOTES - fast online pricing
- Home
- SEM
- Specimen Stubs & Mounts
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin
Product DescriptionDelivery & Returns
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
Delivery is calculated at the checkout, please see our delivery and returns page for more information.
More SEM
AperturesCalibration & Test SpecimensConsumables KitsFilamentsGrids - SEM FinderGrinding & PolishingMaterials EmbeddingMounting Tabs & AdhesivesPreparationReplication MaterialsSpecimen Stub Storage BoxesSpecimen Stubs & MountsSpecimen Stubs - ModularScintillatorsSputter TargetsVacuum Coating MaterialsVacuum Oils & GreasesX-ray Beam FinderX-ray Microanalysis Standards
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.