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Agar Scientific

Microscopy and Lab
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Specimen stubs & mounts

Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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Items 1-12 of 129

  1. SEM cylinder mounts with engraved & numbered divisions for JEOL SEMs

    SEM cylinder mounts with engraved & numbered divisions for JEOL SEMs

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    SEM mounts for JEOL SEMs with engraved and numbered divisions to accommodate multiple smaller samples.
  2. SEM cylinder mounts with engraved & numbered divisions for Hitachi SEMs

    SEM cylinder mounts with engraved & numbered divisions for Hitachi SEMs

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    SEM mounts for Hitachi SEMs with engraved and numbered divisions to accommodate multiple smaller samples.
  3. SEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs

    SEM pin mounts with engraved & numbered divisions

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    SEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.
  4. SEM Cylinder Specimen Mounts
  5. Semclip 50 x 6 x M4 Cylinder Mount, 8 clip
  6. Double Aluminium Mount 90 deg 25 x 16 x M4
  7. Hitachi SEM Cylinder Specimen Mounts

    Hitachi SEM Cylinder Specimen Mounts

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    Cylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.
  8. PELCO Q SEM Pin Stubs

    PELCO Q SEM Pin Stubs

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    !NEW!

    PELCO Scanning Electron Microscopy Pin Stubs. A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.

  9. Hitachi Adjustable Profile Holder, M4

    Hitachi Adjustable Profile Holder, M4

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    Part no: AGY5048

  10. Cross Section Holder, M4

    Cross Section Holder, M4

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    Part no: AGY5590

  11. SEM Pin Stub 18mm diameter

    SEM Pin Stub 18mm diameter, Pk10

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    Part no: AGY5596

  12. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin

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    AGG301, AGG301B and AGG301C SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
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Items 1-12 of 129