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Agar Scientific

Microscopy and Lab
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Specimen stubs & mounts

Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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Items 1-12 of 130

  1. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin

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    AGG301, AGG301B and AGG301C SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
  2. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.

    Part no: AGG301A

  3. AGG301F

    SEM Specimen Stubs - Short Pin

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    SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
  4. FEI Microtome 8mm diameter stub

    FEI Microtome 8mm SEM Stub

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    !NEW!

    A small diameter stub designed for FEI instruments but can also be used with other microscopes.

  5. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin

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    SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium.

    Part no: AGG3325

  6. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
  7. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin

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    SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium.

    Part no: AGG399F

  8. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 20° chamfer

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.

    Part no: AGG3020A

  9. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 45° chamfer

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

    Part no: AGG3020

  10. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 45° chamfer

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

    Part no: AGG301E

  11. SEM Specimen Stubs

    SEM Specimen Stubs, 32mm dia, 8mm pin

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
  12. SEM Specimen Stubs

    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.

    Part no: AGG3160

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Items 1-12 of 130