Calibration and Test Specimens for SEM

Here at Agar Scientific, we specialise in producing a wide range of specimens specifically for SEM test and calibration, where quantification or high resolution results are required.

SEM resolution is tested to a combination of criteria, mainly resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images should show fine detail, together with a lack of noise, evidenced by a good range of grey levels.

Key features:

• Specimens specifically designed for SEM calibration where quantification or high resolution results are required
• Highest possible preparation standards in production
• Certification options for silicon specimen (AGS1932)
• Inspection under an electron microscope
• Agar Scientific calibration specimens for SEM are recognised worldwide for their quality and repeatability
• Available un-mounted or mounted on a stub to suit your microscope

Resolution and Grey Level Test Specimens

For assessments of resolution in scanning electron microscopes, we have developed a range of gold-on-carbon and tin-on-carbon test specimens. These specimens are suitable for tests of SE and BSE imaging, and also for chemical mapping in high resolution systems such as in Auger scanning instruments. Our specimens can be supplied on most types of specimen stub.

Certified Particle Size Standards

Our particle size standards are certified for mean diameter and are traceable to National Institute of Standards and Technology (NIST) standards.

They are available as uniform spheres in a range of discrete sizes from 20nm to 2000μm. The spherical diameters are calibrated with linear dimensions transferred from NIST standard reference materials.

The products can be used for the calibration of electron microscopes, AFMs, light scattering instruments and other particle measuring equipment. Size standards are available in polystyrene, silica or glass.

Magnification Calibration

We offer polystyrene particles and spheres excellent for SEM calibration purposes. It is possible to derive an internal standard of size by mixing a suitable concentration of these particles with the particles of unknown size being studied, with a wide range of sizes available as standard.

Geller Reference Standards

Geller MicroAnalytical Labs produce a variety of magnification reference standards and stage micrometers. These patterned devices are placed in the sample position in optical, scanning electron, vision systems and all types of scanning probe microscopes (STM, AFM, etc.)

All are traceable, under Geller’s ISO-17025 scope of accreditation to national laboratories (NPL in the UK or NIST in the USA). By mutual recognition agreements amongst the national laboratories being traceable to one laboratory is tantamount to being traceable to another.

For more information on the products, visit the product pages or contact: [email protected]