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Calibration standards

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Items 1-12 of 18

  1. MRS-3 EM reference standard

    Geller reference standard MRS-3

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    The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation. Magnifications from 10X to 50,000X. 2µm minimum pitch. Traceable to national labs for ISO9000 and ISO17025.
  2. MRS-4 EM Reference standard

    Geller reference standard MRS-4

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    A fifth Generation, high magnification reference standard for instrument calibration from 10X to 200,000X (1/2µm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.
  3. MRS-6 Reference Standards

    Geller reference standard MRS-6

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    A fifth generation Magnification Reference Standard & Stage Micrometer for instrument calibration from 1,500X to 1,000,000X (80nm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.
  4. MRS-3 EM reference standard

    Geller reference standard re-callibration service

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    Geller MicroAnalytical magnification standards can be cleaned and re-certified to assure continued use as a traceable standard.

  5. 145nm AFM Reference Standard

    145nm AFM Reference Standard for AFM

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    The 145nm pitch is accurate to ±1nm.
  6. High resolution AFM reference standards

    292nm pitch resolution reference standards for AFM

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    292nm pitch reference standard for very high resolution calibration of AFM.
  7. 2-D holographic array standards

    2-D holographic array standards

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    2-D holographic array standards for simultaneous calibration of X and Y axes.
  8. Highly ordered pyrolytic graphite (HOPG)

    Highly ordered pyrolytic graphite (HOPG)

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    HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopy.

  9. Gold calibration kit

    Gold calibration kit

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    Gold colloids of known size provide a reliable means of characterising tip geometry and calibrating the Z-axis to piezoelectric response.
  10. Calibration gratings - TGXYZ series

    Calibration gratings - TGXYZ series

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    Calibration gratings arrays of different structures comprising rectangular silicon dioxide steps on a silicon wafer.

  11. SEM image of a TGX01 grating

    Grating type TGX

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    The TGX series silicon calibration grating is an array of square holes with sharp undercut edges formed by the (110) crystallographic planes of silicon. The typical radius of the edges is less than 5 nm
  12. Calibration grating sets TGS

    Calibration grating sets TGS

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    Sets of calibration gratings and test structures are available to suit different requirements.
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Items 1-12 of 18