Menu
ORDER ONLINE - quick & easy
AGENTS & DISTRIBUTORS - available worldwide
REQUEST QUOTES - fast online pricing

Pelco Nanogold resolution test standards for SEM and FESEM

Unique gold nanoparticles on silicon provide resolution standards with known and uniform particle size, ideally suited for high resolution tests for SEM, FESEM and FIB/SEM systems.

All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGS1808
38nm Nanogold High Resolution Test on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1808A
38nm Nanogold High Resolution Test on JEOL Stub 10 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1808B
38nm Nanogold High Resolution Test on ISI Stub 15 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1808C
38nm Nanogold High Resolution Test on Hitachi Stub 15 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1808D
38nm Nanogold High Res Specimen on Customer Specified Stub*
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1808E
38nm Nanogold High Resolution Test on JEOL stub 12.5 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1808U
38nm Nanogold High Resolution Test Unmounted
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809
27.3nm Nanogold High Resolution Test on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809A
27.3nm Nanogold High Resolution Test on JEOL Stub 10 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809B
27.3nm Nanogold High Resolution Test on ISI Stub 15 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809C
27.3nm Nanogold High Resolution Test on Hitachi Stub 15 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809D
27.3nm Nanogold High Res Specimen on Customer Specified Stub*
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809E
27.3nm Nanogold High Resolution Test on JEOL stub 12.5 mm dia., 10 mm height
Loading...  Loading...
Loading...  Loading...
POA
POA
AGS1809U
27.3nm Nanogold High Resolution Test Unmounted
Loading...  Loading...
Loading...  Loading...
POA
POA
Product Description

These unique Pelco® gold nanoparticles on silicon provide resolution standards with known and uniform particle size, ideally suited for high resolution tests for SEM, FESEM and FIB/SEM systems. The known particle size combined with uniformity provides a real indication of the performance of the SEM or FESEM. The Nanogold on silicon resolution standards are available in two size ranges:

38nm (±4nm) for high resolution SEM applications 27.3nm for ultra high resolution FESEM applications

Provided on 5 x 5mm silicon wafer chip, unmounted or on the specimen mount of your choice.

* When requesting a quote for AGS1808D or AGS1809D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.

Technical DataDelivery & Returns
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.