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SEM Specimen Stubs, 32mm dia, 8mm pin

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGG400
Aluminium pin stubs, 32mm dia. Pack of 50
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POA
POA
AGG400B
Brass pin stubs, 32mm dia. Pack of 10
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POA
POA
AGG400F
Aluminium pin stubs, short, 32mm dia. Pack of 50
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POA
POA
Product Description
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
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