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Silicon piezo-resistive self-sensing cantilever - with thermal actuator

Self-Sensing Silicon Cantilever with integrated piezo-resistor bridge and a thermal heater for non-contact and contact mode applications. Resonant frequency 30-95kHz. Spring constant 1-56N/m.
All prices exclude VAT.
Name & Code
Grouped product items
Code & Description Availability Price Qty
AGF1850
Piezoresistive 300x100µm self sensing silicon cantilever, 6x5mm PCB, 30-65kHz
Average lead time: 29 days
Average lead time: 29 days
£118.12
£118.12
AGF1851
Piezoresistive 300x100µm self sensing silicon cantilever, 6x5mm PCB 65-95kHz
Average lead time: 29 days
Average lead time: 29 days
£118.12
£118.12
AGF1852
Piezoresistive 300x100µm self sensing silicon cantilever, 30-65kHz (chip only, without PCB)
Average lead time: 29 days
Average lead time: 29 days
£112.74
£112.74
AGF1853
Piezoresistive 300x100µm self sensing silicon cantilever, 65-95kHz (chip only, without PCB)
Average lead time: 29 days
Average lead time: 29 days
£112.74
£112.74
Product Description

Piezo-Resistive Sensing Active (PRSA) probes are silicon cantilevers with an integrated piezo-resistor and a thermal actuator for self-sensing and self-actuating scanning probe microscopy applications. The piezo-resistors are integrated into a matched Wheatstone bridge to optimize the sensitivity and compensate environmental thermal drift By using the self-sensing readout no laser adjustment is necessary in comparison to conventional optical readout AFM systems. This gains time during a cantilever change. Furthermore free space above the cantilever opens a door for new applications and various instrument combinations.

The cantilever provides a sharp tip for accurate measurements in various applications. The cantilever chip is bonded onto a small printed circuit board with a small connector. The loading process of a fragile cantilever equipped with a connector is more easy and save. The counterpart PCB of the cantilever PCB is connected to a low-noise amplifier by a flat-flex-cable.

Applications

  • Integration on a standard AFM scanner
  • Force or deflection measurement within TEM, SEM, XPS, etc.
  • Torque magnetometry
  • Tip-scanning high-speed AFM
  • Various cantilever based sensor applications (media properties, air pressure/acoustic wave, etc.)
Technical DataDelivery & Returns
LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.