Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 12.5mm dia, 20° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.

Part no: AGG3020A
SEM Specimen Stubs, 12.5mm dia, 45° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

Part no: AGG3020
SEM Specimen Stubs, 12.5mm dia, 45° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

Part no: AGG301E
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.

Part no: AGG3160
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.

Part no: AGG3162
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.

Part no: AGG3161
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin. EBSD.
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.

Part no: AGG3163
SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

Part no: AGG3164
SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

Part no: AGG3165
SEM Specimen Stubs, 15mm dia, angled stub, 45° chamfer
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SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled stub, 45° chamfer. Aluminium.

Part no: AGG308
SEM Specimen Stubs, 10mm dia, stub angled 45°
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SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.

Part no: AGG3309
SEM Specimen Stubs, 10mm dia, 10mm high, 45° chamfer
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SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.

Part no: AGG3166