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Specimen stubs & mounts

Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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  1. SEM Specimen Stubs

    SEM Specimen Stubs, 32mm dia, 10mm high

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    SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.

    Part no: AGG318

  2. SEM Specimen Stubs

    SEM Specimen Stubs, 15mm dia, 10mm high

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    SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, 10mm high. Aluminium. Pack of 50.

    Part no: AGG307

  3. SEM Specimen Stubs, 10mm dia, 10mm high

    SEM Specimen Stubs, 10mm dia, 10mm high

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    SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
  4. SEM Specimen Stubs

    SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage

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    SEM Specimen Stubs for JEOL instruments. 10mm diameter.

    Part no: AGG306A

  5. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 10mm high

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    SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.

    Part no: AGG3384

  6. SEM Specimen Stubs

    SEM Specimen Stubs, 12.5mm dia, 5mm high

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    SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.

    Part no: AGG3385

  7. SEM Specimen Stubs

    SEM Specimen Stubs, 32mm dia, 20mm high

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    SEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.
  8. SEM Specimen Stubs 50mm dia

    SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20)

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    SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.

    Part no: AGG3387-20

  9. SEM Specimen Stubs

    SEM Specimen Stubs, 32mm dia, 5mm high

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    SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.

    Part no: AGG3376

  10. SEM Specimen Stubs, 15mm dia, 5mm high

    SEM Specimen Stubs, 15mm dia, 5mm high

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    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.
  11. SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub

    SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub

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    SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 5mm, cylinder stubs. Aluminium.
  12. SEM cylinder mounts with engraved & numbered divisions for JEOL SEMs

    SEM cylinder mounts with engraved & numbered divisions for JEOL SEMs

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    SEM mounts for JEOL SEMs with engraved and numbered divisions to accommodate multiple smaller samples.
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Items 1-12 of 23

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  3. of 2 pages

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  1. SEM specimen stubs (19)
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