Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
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AGG301, AGG301B and AGG301C SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.

Part no: AGG301A
SEM Specimen Stubs - Short Pin
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SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin
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SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium.

Part no: AGG3325
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin
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SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium.

Part no: AGG399F
SEM Specimen Stubs, 12.5mm dia, 20° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.

Part no: AGG3020A
SEM Specimen Stubs, 12.5mm dia, 45° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

Part no: AGG3020
SEM Specimen Stubs, 12.5mm dia, 45° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

Part no: AGG301E
SEM Specimen Stubs, 32mm dia, 8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.

Part no: AGG3160
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.

Part no: AGG3162