
Specimen stubs & mounts
Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
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SEM Specimen Stubs, 25.4mm square. Gun residue holders
More InformationSEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.Part no: AGG3595
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SEM cylinder mounts with engraved & numbered divisions for JEOL SEMs
More InformationSEM mounts for JEOL SEMs with engraved and numbered divisions to accommodate multiple smaller samples. -
SEM cylinder mounts with engraved & numbered divisions for Hitachi SEMs
More InformationSEM mounts for Hitachi SEMs with engraved and numbered divisions to accommodate multiple smaller samples. -
SEM pin mounts with engraved & numbered divisions
More InformationSEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs. -
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Hitachi SEM Cylinder Specimen Mounts
More InformationCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter. -
PELCO Q SEM Pin Stubs
More Information!NEW!
PELCO Scanning Electron Microscopy Pin Stubs. A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.
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