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Specimen stubs & mounts

Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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Items 37-48 of 130

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  1. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer

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    SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.

    Part no: AGG3170

  2. SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer

    SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer

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    SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.

    Part no: AGG3171

  3. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer

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    SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.

    Part no: AGG3172

  4. SEM Specimen Stubs

    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread

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    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium.

    Part no: AGG3313

  5. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread

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    SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.

    Part no: AGG3377

  6. SEM Specimen Stubs

    SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread

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    SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.

    Part no: AGG3318

  7. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, threaded pin

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    SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.

    Part no: AGG3025

  8. SEM Specimen Stubs

    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45° chamfer

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    SEM Specimen Stubs for HITACHI instruments. 15mm diameter.

    Part no: AGG3313A

  9. SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer

    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer

     More Information
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.

    Part no: AGG3313D

  10. SEM Specimen Stubs

    SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD

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    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.

    Part no: AGG3313B

  11. AGG319

    Pin Stub - 100mm dia x 9.5mm Pin Height

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    Aluminium pin stub available for AMRAY, Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan & TESCAN.

    Part no: AGG319

  12. AGG3205C SEM Specimen Stubs for Environmental Microscopy

    SEM Specimen Stubs for Environmental Microscopy

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    Environmental Microscopy specimen stubs.
Set Descending Direction

Items 37-48 of 130

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  3. 3
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  7. of 11 pages

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Microscope Make
  1. AMRAY (1)
  2. CAMBRIDGE ANALYSIS (2)
  3. CAMBRIDGE S600 (1)
  4. Deben coolstage specimen stubs (1)
  5. FEI-ESEM (1)
  6. Forensic science stubs (1)
  7. HITACHI (21)
  8. ISI/ABT/TOPCON (4)
  9. JEOL (24)
  10. LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS (22)
  11. LEO/ZEISS (2)
Range
  1. Adhesives (1)
  2. SEM specimen stubs (69)
  3. SEMClip specimen mounts (16)
Material
  1. Aluminium (57)
  2. Aluminium - high purity (1)
  3. Beryllium (1)
  4. Brass (4)
  5. Carbon (10)
  6. Copper (3)
Style
  1. Angled stubs (20)
  2. Cylinder stubs (23)
  3. Low profile pin stubs (6)
  4. M4 threaded stubs (12)
  5. Other stubs (6)
  6. Pin stubs (18)

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