Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 10mm dia, stub angled 45°
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SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.

Part no: AGG3309
SEM Specimen Stubs, 12.5mm dia, 10mm high
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SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.

Part no: AGG3384
SEM Specimen Stubs, 12.5mm dia, 5mm high
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SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.

Part no: AGG3385
SEM Specimen Stubs, 32mm dia, 20mm high
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SEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.
SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20)
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SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.

Part no: AGG3387-20
SEM Specimen Stubs, 32mm dia, 5mm high
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SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.

Part no: AGG3376
SEM Specimen Stubs, 15mm dia, 5mm high
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SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.
SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub
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SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 5mm, cylinder stubs. Aluminium.
SEM Specimen Stubs, 10mm dia, 10mm high, 45° chamfer
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SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.

Part no: AGG3166
SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer
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SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.

Part no: AGG3167
SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for EBSD
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SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD . Aluminium.

Part no: AGG3168
SEM Specimen Stubs, 25mm dia, 20mm high, angled 30° chamfer
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SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 30° chamfer. Aluminium.

Part no: AGG3169