Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 15mm dia, 10mm high
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SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, 10mm high. Aluminium. Pack of 50.

Part no: AGG307
SEM Specimen Stubs, 15mm dia, angled stub, 45° chamfer
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SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled stub, 45° chamfer. Aluminium.

Part no: AGG308
SEM Specimen Stubs, 15mm dia, angled, carbon
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SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.

Part no: AGG3425
SEM Specimen Stubs, 15mm dia, 10mm high, carbon
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SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, 10mm high. Carbon

Part no: AGG325

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Specimen stubs & mounts

SEM Specimen Stubs, 15mm dia, 10mm high

SEM Specimen Stubs, 15mm dia, angled stub, 45° chamfer

SEM Specimen Stubs, 15mm dia, angled, carbon

SEM Specimen Stubs, 15mm dia, 10mm high, carbon

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