Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
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AGG301, AGG301B and AGG301C SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.

Part no: AGG301A
FEI Microtome 8mm SEM Stub
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!NEW!

A small diameter stub designed for FEI instruments but can also be used with other microscopes.
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
SEM Specimen Stubs, 12.5mm dia, 20° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.

Part no: AGG3020A
SEM Specimen Stubs, 12.5mm dia, 45° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

Part no: AGG3020
SEM Specimen Stubs, 12.5mm dia, 45° chamfer
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.

Part no: AGG301E
SEM Specimen Stubs, 32mm dia, 8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.

Part no: AGG3160
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.

Part no: AGG3162
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.

Part no: AGG3161
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin. EBSD.
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SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.

Part no: AGG3163