Specimen stubs & mounts
Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
4 Item(s)
-
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
More InformationAGG301, AGG301B and AGG301C SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. -
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
More InformationSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm. -
SEM Specimen Stubs, 32mm dia, 8mm pin
More InformationSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm. -
SEM Specimen Stubs, 10mm dia, 10mm high
More InformationSEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
4 Item(s)
SEM
Category Navigation:
Refine your search
- Microscope Make
- Range
- Style
-
- Cylinder stubs (1)
- Pin stubs (3)
Loading...