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Agar Scientific

Microscopy and Lab
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Specimen stubs & mounts

Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

Set Descending Direction

10 Item(s)

  1. Carbon stubs

    SEM Specimen Stubs, 12.5mm dia, carbon

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    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon

    Part no: AGG321

  2. Carbon stubs

    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon

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    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.

    Part no: AGG3423

  3. Carbon stubs

    SEM Specimen Stubs, 32mm dia, re-entrant base, carbon

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    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.

    Part no: AGG327

  4. Carbon stubs

    SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon

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    SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon

    Part no: AGG3427

  5. Carbon stubs

    SEM Specimen Stubs, 10mm dia, 10mm high, carbon

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    SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high. Carbon

    Part no: AGG323

  6. Carbon stubs

    SEM Specimen Stubs, 10mm dia, angled, carbon

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    SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.

    Part no: AGG3424

  7. Carbon disc on stub

    Carbon disc on 12.5mm stub. Box of 10

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    A 3mm thick carbon disc mounted on a conventional 12.5mm stub that provides an economical solution for microanalysis or low emission surface imaging applications requiring light element stubs.

    Part no: AGG3420

  8. Carbon discs

    Carbon discs

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    A range of 3mm thick carbon discs for mounting specimens.
  9. Carbon stubs

    SEM Specimen Stubs, 15mm dia, 10mm high, carbon

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    SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, 10mm high. Carbon

    Part no: AGG325

  10. Carbon stubs

    SEM Specimen Stubs, 15mm dia, angled, carbon

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    SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.

    Part no: AGG3425

Set Descending Direction

10 Item(s)