Specimen stubs & mounts
Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
3 Item(s)
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SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
More InformationAGG301, AGG301B and AGG301C SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. -
SEM Specimen Stubs for Environmental Microscopy
More InformationEnvironmental Microscopy specimen stubs. -
TEM grid holder on SEM pin stub
More InformationA pin-type aluminium stub allowing four TEM grids to be securely held for SEM work.
3 Item(s)
SEM
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