Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

Agar fast drying silver suspension
More Information

A very fine flake silver is suspended in methyl isobutylketone (4-methylpentan-2-one) and forms a thin, smooth, highly conductive silver film which is both adherent and flexible.
SEM Specimen Stubs, 10mm dia, 5mm high
More Information
SEM Specimen Stub.

Part no: AGG306E
Slotted specimen stub
More Information
12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination.

Part no: AGG301D
Aluminium pin stubs - high purity - pack of 100
More Information
High purity aluminium pin stubs

Part no: AGG301P
SEM Specimen Stubs, 12.5mm dia, carbon
More Information
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon

Part no: AGG321
SEM Specimen Stubs, 10mm dia, 10mm high, carbon
More Information
SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high. Carbon

Part no: AGG323
SEM Specimen Stubs, 15mm dia, 10mm high, carbon
More Information
SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, 10mm high. Carbon

Part no: AGG325
SEM Specimen Stubs, 32mm dia, re-entrant base, carbon
More Information
SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.

Part no: AGG327
Ink pen for SEM
More Information
Fine point writing pen which leaves a mark that can be read in the electron beam of the SEM.

Part no: AGG3344
Gripping Stub
More Information
A small gripping stub enabling specimens to be mounted edge-on for SEM examination.

Part no: AGG3392
Carbon disc on 12.5mm stub. Box of 10
More Information
A 3mm thick carbon disc mounted on a conventional 12.5mm stub that provides an economical solution for microanalysis or low emission surface imaging applications requiring light element stubs.

Part no: AGG3420
SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon
More Information
SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.

Part no: AGG3423