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Geller Reference Standards

Geller Reference Standards

Geller MicroAnalytical Labs produce a variety of magnification reference standards/stage micrometers. These patterned devices are placed in the sample position in optical, scanning electron, Vision Systems and all types of scanning probe microscopes (STM, AFM, etc). Three different devices are currently available. They are all traceable, under Geller's ISO-17025 scope of accreditation, to national laboratories, either NPL in the UK or NIST in the USA. By mutual recognition agreements amongst the national laboratories being traceable to one laboratory is tantamount to being traceable to another.

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4 Item(s)

  1. MRS-3 EM reference standard

    Geller reference standard MRS-3

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    The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation. Magnifications from 10X to 50,000X. 2µm minimum pitch. Traceable to national labs for ISO9000 and ISO17025.
  2. MRS-4 EM Reference standard

    Geller reference standard MRS-4

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    A fifth Generation, high magnification reference standard for instrument calibration from 10X to 200,000X (1/2µm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.
  3. MRS-6 Reference Standards

    Geller reference standard MRS-6

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    A fifth generation Magnification Reference Standard & Stage Micrometer for instrument calibration from 1,500X to 1,000,000X (80nm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.
  4. MRS-3 EM reference standard

    Geller reference standard re-callibration service

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    !NEW!

    Geller MicroAnalytical magnification standards can be cleaned and re-certified to assure continued use as a traceable standard.

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4 Item(s)