Calibration & test specimens

Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.
For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.

1000 mesh calibration grid
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A single 1000 mesh 3mm diameter TEM grid for calibration. Supplied in a vial.

Part no: AGS1965
Fine mesh
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This is available in copper, nickel or gold, in 1000, 1500 and 2000 mesh (1000, 1500 or 2000 repeat distance per inch), ie. 25, 18.75 and 12.5 µm.
Geller reference standards MRS-3
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The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation including scanning, optical reflection and transmission, scanning probe and confocal microscopy.
Geller reference standards MRS-4
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For high magnification calibration, two additional nested squares with pitches of 1 and 0.5µm extend the useful calibration range to x200,000.
Geller reference standards MRS-6
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A fifth generation, NIST and NPL Traceable, Magnification Reference Standard & Stage Micrometer. For Instrument Calibration from 1,500X – 1,000,000X (80nm min. pitch).
SEM 144nm reference standard
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These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
SEM 300nm reference standard
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These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
SEM 144nm reference standard, certified
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These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.
Polystyrene latex particles
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This range of polystyrene particles is excellent for SEM calibration purposes.
Polystyrene latex spheres
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This range of polystyrene latex spheres can be used for either SEM or TEM applications.
Monosized microsphere size standards 1 - 1000 um
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These highly uniform polystyrene spheres are calibrated by NIST standardised methods which include photon correlation spectroscopy, transmission electron microscopy and light microscopy.
Uniform polymer microspheres 5 - 40 um
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This series of microspheres has a slightly wider distribution than the monodisperse microsphere size standards.