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Agar Scientific

Microscopy and Lab
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SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer

SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.

All prices exclude VAT.

SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.

Description Code Stock Unit Price Qty
SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer
AGG3170
In Stock
EA

£5.90

£3.96

   

SEM Specimen Stubs

  • SEM Specimen Stubs