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SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer

SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.
All prices exclude VAT.
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AGG3170
In Stock
£7.72
Product Description

SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.