SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon
SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon.
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Product DescriptionDelivery & Returns
SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.
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