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Agar Scientific

Microscopy and Lab
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Specimen Preparation

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Items 1-12 of 14

  1. Indium Wire

    Indium Wire

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    Indium wire for high vacuum seals in clean systems.

    Part no: AGE432

  2. Abrasive strips - diamond

    Abrasive strips - Diamond

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    A range of diamond abrasive strips and sheets with resin-bonded polishing powder on a polyester backing.

  3. Glutaraldehyde fixative for electron microscopy

    Glutaraldehyde fixative

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    Glutaraldehyde is used in biological electron microscopy as a fixative, several grades are available.
  4. Ralph knifemaker

    Glass knifemakers for histology knives

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    Ralph knifemakers have been designed to be easy to use, giving consistent and reproducible results.
  5. Carbon discs

    Carbon discs

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    A range of 3mm thick carbon discs for mounting specimens.
  6. Disposable polyethylene storage syringes

    Disposable polyethylene storage syringes

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    Ungraduated, polyethylene syringes suitable for frozen storage of embedding media, ready for convenient dispensing into capsules.
  7. Millipore® filters, holders and syringes

    Millipore filters, holders and syringes

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    Millipore® membrane filters are composed of biologically inert mixtures of cellulose acetate and cellulose nitrate.
  8. Evaporation metals

    Evaporation metals

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    High purity wires and materials for use in evaporation and shadow casting.
  9. Abrasive strips - Aluminium Oxide

    Abrasive strips - Aluminium Oxide

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    A range of Aluminium Oxide abrasive strips and sheets with resin-bonded polishing powder on a polyester backing.
  10. Carbon stubs

    SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon

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    SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon

    Part no: AGG3427

  11. Carbon stubs

    SEM Specimen Stubs, 32mm dia, re-entrant base, carbon

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    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.

    Part no: AGG327

  12. SEM Specimen Stubs

    SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer

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    SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.

    Part no: AGG3170

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Items 1-12 of 14