New Products
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SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin
More InformationSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.Part no: AGG3160
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SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin
More InformationSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.Part no: AGG3161
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SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin
More InformationSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.Part no: AGG3164
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SEM Specimen Stubs, 12.7mm dia, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 15mm
More InformationCylinder mount SEMClips for Hitachi SEMs, with M4 thread. 15mm diameter. -
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profile
More InformationThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.
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Modular T-Base Adapter for Hitachi FESEM
More InformationNew style modular T-Base adapter for Hitachi S-4800, SU-70, SU6600 and SU8000 series FESEM's.
Part no: AG15370-1
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Compact Variable Tilt Mount, M4
More InformationThis Compact Variable Tilt Specimen Mount allows for easy mounting and tilting small samples from 0° to 90° and SEM investigation with small working distances.Part no: AG15439
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