This specimen is particularly suitable for assessing the image quality of high resolution SEMs, such as those fitted with a field emission electron source. A magnification of at least x80,000 is required to clearly resolve the gold particles. Particle sizes range from <3 - 50nm.
* When requesting a quote for AGS1969D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
SEM Specimen mounts selection guide
*All unless otherwise specified.
Type | Mount | Part Code |
AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
AGSXXXXS | Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin | AGG301F |
AGSXXXXT | Unmounted, thin carbon disc | - |
AGSXXXXU | Unmounted | - |
AGS1969, A, B, C, D, E, T & U Technical Datasheet