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292nm pitch resolution reference standards for AFM

292nm pitch reference standard for very high resolution calibration of AFM.

All prices exclude VAT.

The 292nm pitch is accurate to ±1%. The surface structure is titanium lines on silicon. The line height is approximately 30nm with a line width of 130nm (not calibrated).

For AFM it can be used in contact, tapping, and other modes, with image sizes from 500nm to 20µm.

It can be supplied either non-certified, or with a non-traceable manufacturer’s certificate stating average pitch based on batch measurements.

Description Code Stock Unit Price Qty
292nm AFM Reference Standard on 12mm Disc AGF7055 Lead time:
14 days
292nm Traceable AFM Reference Standard 12mm Disc AGF7055T Lead time:
14 days

High resolution AFM reference standards

  • High resolution AFM reference standards