Agar provides improved standards for AFM with Geller NIST and NPL-traceable calibration samples

Stansted, 1st March, 2013, updated May 2014

As a leading supplier of accessories for microscopy, Agar Scientific has long been known for the quality of its wide range of calibration standards for Electron Microscopy. For AFM users, the Geller reference standards MRS-3, 4 and 6 are a series of high quality standards that are NIST/NPL traceable. They allow the accurate calibration of scanning probe instruments such as STM and AFM. The magnification range is from ~10X to 1,000,000X. The copyrighted pattern consists of a series of nested squares with pitches of 0.08, 0.1, 0.5, 1, 2, 50, and 500μm with a pattern height that is a NIST traceable 0.1μm. Squares are used such that magnification can be calibrated in two directions. The MRS-6 has pitch patterns from 2μm to 80nm with an uncertainty less than 3nm.

These Certified Reference Materials are generated using the magnification calibration procedures for optical, video and scanning microscopies as described in ASTM method E766-88. Traceable measurements are provided for the 2, 1 and 0.1μm pitch patterns. Full details are supplied on the accompanying measurement certificates. These standards provide particularly fine pitch patterns. The 80nm pitch has a nominal space width of 40nm. Users of such standards must be aware that the cantilever tip must be smaller to define the pattern.

For routine use, Agar Scientific also offers a range of consumables for AFM studies. Specimen discs in varying sizes and assorted materials provide consistently flat surfaces for easy mounting of AFM specimens. Magnetic stainless steel, mica and glass are available. Combined with custom gripper’s and pickup tools, the specimen discs can be readily demounted after use and placed in specifically designed boxes for dust free storage.

Further detailed information for Geller reference standards.